VERIFICATION OF A POLARIZATION-INSENSITIVE OPTICAL INTERFEROMETER SYSTEM WITH SUBNANOMETRIC CAPABILITY

被引:9
作者
DOWNS, MJ
BIRCH, KP
COX, MG
NUNN, JW
机构
[1] National Physical Laboratory, Teddington, Middlesex
来源
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING | 1995年 / 17卷 / 02期
关键词
D O I
10.1016/0141-6359(94)00004-J
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The performance of a length-measuring interferometer system designed to be insensitive to stray reflections and polarization effects resulting in a subnanometric measurement capability is described. Results from the mathematical analysis of the interferometer signals, which provided accurate fringe subdivision and allowed a 1 sigma of 0.15 nm to be realized from this system, are also described. The motion of a piezoelectric transducer (PZT) was characterized over a 1-mu m range using the system, and the results were used to confirm this subnanometric measurement capability of the interferometer.
引用
收藏
页码:84 / 88
页数:5
相关论文
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