A NOVEL ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES

被引:26
|
作者
HAASE, O
BORBONUS, M
MURALT, P
KOCH, R
RIEDER, KH
机构
[1] Institut für Experimentalphysik, Freie Universität, Berlin, 1000 Berlin 33
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 05期
关键词
D O I
10.1063/1.1141156
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel design of a scanning tunneling microscope (STM) for surface science studies is described. The STM is fully compatible with ultrahigh vacuum (UHV) and offers the possibility of performing individual STM scans over a large region of the sample surface (≃10 mm2). The sample coarse approach is realized by a fine pitch screw, which shifts two wedges against each other. In order to incorporate the STM in an UHV system for the standard preparation and analyzing techniques of surface science, a special sample holder and sample transfer system has been developed. For defined heating of the sample, disconnectable electrical wiring for both a resistively heated oven and a thermocouple has been integrated within the sample holder.
引用
收藏
页码:1480 / 1483
页数:4
相关论文
共 50 条
  • [21] NEW VARIABLE LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE FOR USE IN ULTRAHIGH-VACUUM
    SMITH, AR
    SHIH, CK
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (03): : 2499 - 2503
  • [22] In situ cleavage mechanism for semiconductor single crystals for ultrahigh-vacuum scanning tunneling microscope
    S. I. Oreshkin
    V. N. Mantsevich
    D. A. Muzychenko
    A. I. Oreshkin
    V. I. Panov
    I. V. Radchenko
    Instruments and Experimental Techniques, 2007, 50 : 129 - 132
  • [23] In situ cleavage mechanism for semiconductor single crystals for ultrahigh-vacuum scanning tunneling microscope
    Oreshkin, S. I.
    Mantsevich, V. N.
    Muzychenko, D. A.
    Oreshkin, A. I.
    Panov, V. I.
    Radchenko, I. V.
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2007, 50 (01) : 129 - 132
  • [24] VARIABLE-TEMPERATURE ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE - MECHANICAL AND ELECTRONIC INSTRUMENTATION
    ZUGER, O
    OTT, HP
    DURIG, U
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (12): : 5634 - 5643
  • [25] A low-temperature ultrahigh-vacuum scanning tunneling microscope with rotatable magnetic field
    Wittneven, C
    Dombrowski, R
    Pan, SH
    Wiesendanger, R
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (10): : 3806 - 3810
  • [26] ULTRAHIGH-VACUUM SCANNING-TUNNELING MICROSCOPE FOR INSITU STUDIES OF ANNEALING AND ELECTROMIGRATION BEHAVIOR OF THIN-FILMS
    REISS, G
    LEVINE, LE
    SMITH, DA
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (01): : 108 - 111
  • [27] A SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES
    DEMUTH, JE
    HAMERS, RJ
    TROMP, RM
    WELLAND, ME
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) : 396 - 402
  • [28] VERSATILE ULTRAHIGH-VACUUM SCANNING ELECTRON-MICROSCOPE
    BANBURY, JR
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (08): : 798 - &
  • [29] BEETLE-LIKE SCANNING TUNNELING MICROSCOPE FOR ULTRAHIGH-VACUUM AND LOW-TEMPERATURE APPLICATIONS
    SCHULZ, RR
    ROSSEL, C
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (06): : 1918 - 1922
  • [30] NANOMETER-SCALE PATTERNING AND OXIDATION OF SILICON SURFACES WITH AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE
    LYDING, JW
    ABELN, GC
    SHEN, TC
    WANG, C
    TUCKER, JR
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3735 - 3740