DESIGN OF TEST SEQUENCES FOR VLSI SELF-TESTING USING LFSR

被引：10
作者：
HOLLMANN, H
机构：
[1] Philips Natuurkundig Laboratory, WY 2.58, Eindhoven
来源：
IEEE TRANSACTIONS ON INFORMATION THEORY | 1990年 / 36卷 / 02期
关键词：
D O I：
10.1109/18.52485
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Consider a shift register (SR) of length n and a collection of designated subsets of {0,1,…,n-1}. The problem is how to add feedback to the SR such that the resulting linear feedback shift register (LFSR) exercises (almost) exhaustively each of the designated subsets and is moreover of small period. Several previously known results for maximum length LFSR are extended to more general LFSR, and in particular a previously known algorithm is simplified and extended. Applications to the problems of VLSI self-testing are discussed and illustrated. © 1990 IEEE
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页码：386 / 392
页数：7
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