APPLICATIONS OF TIME-DOMAIN METROLOGY TO AUTOMATION OF BROAD-BAND MICROWAVE MEASUREMENTS

被引：31

|

作者：

NICOLSON, AM

SUSMAN, L

BENNETT, CL

LAMENSDO.D

机构：

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1972年 / MT20卷 / 01期

关键词：

D O I：

10.1109/TMTT.1972.1127671

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：3 / &

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