APPLICATIONS OF TIME-DOMAIN METROLOGY TO AUTOMATION OF BROAD-BAND MICROWAVE MEASUREMENTS

被引：31
|
作者：
NICOLSON, AM
SUSMAN, L
BENNETT, CL
LAMENSDO.D
机构：
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1972年 / MT20卷 / 01期
关键词：
D O I：
10.1109/TMTT.1972.1127671
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：3 / &
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