INTERVALENCE BAND ABSORPTION-COEFFICIENT MEASUREMENTS IN BULK LAYER, STRAINED AND UNSTRAINED MULTIQUANTUM-WELL 1.55 MU-M SEMICONDUCTOR-LASERS

被引:37
作者
JOINDOT, I [1 ]
BEYLAT, JL [1 ]
机构
[1] ALCATEL ALSTHOM RECH,F-91460 MARCOUSSIS,FRANCE
关键词
LASERS; SEMICONDUCTOR LASERS;
D O I
10.1049/el:19930405
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Measurements are reported of intervalence band absorption (IVBA) coefficient k0 in three types of active layer structure: bulk, unstrained (MQW) and strained multiquantum wells. The IVBA measurements are performed by observing the spontaneous emission from the uncleaved facets of DCPBH Fabry-Perot lasers k0 = (3-7 +/- 0-3) x 10(-17) cm2 is obtained for bulk, (1.4 +/- 0-2) x 10(-16) cm2 for MQW unstrained and (3.5 +/- 0.3) x 10(-17) cm2 for strained MQW structures.
引用
收藏
页码:604 / 606
页数:3
相关论文
共 6 条
[1]  
BEYLAT JL, ECOC 92 BERLIN, P895
[2]   VERY NARROW-LINEWIDTH (70KHZ) 1.55-MU-M STRAINED MQW DFB LASERS [J].
BISSESSUR, H ;
STARCK, C ;
EMERY, JY ;
POMMEREAU, F ;
DUCHEMIN, C ;
PROVOST, JG ;
BEYLAT, JL ;
FERNIER, B .
ELECTRONICS LETTERS, 1992, 28 (11) :998-999
[3]  
BUCHS G, 1992, APPL PHYS LETT, V60, P231
[4]   1.5-MU-M LASER WITH HIGH EXTERNAL QUANTUM EFFICIENCY AND CONTROLLED EMISSION WAVELENGTH [J].
FERNIER, B ;
BROSSON, P ;
JICQUEL, JP ;
BENOIT, J .
IEE PROCEEDINGS-J OPTOELECTRONICS, 1987, 134 (01) :27-34
[5]   MEASUREMENTS OF RELATIVE INTENSITY NOISE (RIN) IN SEMICONDUCTOR-LASERS [J].
JOINDOT, I .
JOURNAL DE PHYSIQUE III, 1992, 2 (09) :1591-1603
[6]  
LACOURSE J, 1988, 11TH IEEE INT SEM LA, V1, P206