ATOMIC-NUMBER AND CRYSTALLOGRAPHIC CONTRAST IMAGES WITH THE SEM - A REVIEW OF BACKSCATTERED ELECTRON TECHNIQUES

被引:422
作者
LLOYD, GE
机构
关键词
D O I
10.1180/minmag.1987.051.359.02
中图分类号
P57 [矿物学];
学科分类号
070901 ;
摘要
Using SEM backscattered electron techniques, three types of image can be obtained: atomic number contrast (Z-contrast), images based on changes in crystal structure, and electron channelling patterns, distinct configurations of lines and bands of different contrasts which are unique for a particular crystal structure (orientation). Electron channelling patterns (ECP) need subsequent interpretation, which depends on the crystal structure and the relationship between crystal and specimen coordinate systems. A general solution is presented, involving the construction of reference ECP maps over the surface of a sphere.-R.A.H.
引用
收藏
页码:3 / 19
页数:17
相关论文
共 83 条
[1]   THE MEASUREMENT OF ATOMIC-NUMBER AND COMPOSITION IN AN SEM USING BACKSCATTERED DETECTORS [J].
BALL, MD ;
MCCARTNEY, DG .
JOURNAL OF MICROSCOPY-OXFORD, 1981, 124 (OCT) :57-68
[2]  
BISHOP HE, 1966, 4TH ICXOM ORS, P153
[3]  
BISHOP HE, 1974, QUANTITATIVE SCANNIN, P41
[4]   SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J].
BOOKER, GR ;
SHAW, AMB ;
WHELAN, MJ ;
HIRSCH, PB .
PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1185-&
[5]   DEFORMATION OF CHROMITE - SEM INVESTIGATIONS [J].
CHRISTIANSEN, FG .
TECTONOPHYSICS, 1986, 121 (2-4) :175-196
[6]   KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J].
COATES, DG .
PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1179-&
[7]   MULTIPLE SCATTERING OF 5-30 KEV ELECTRONS IN EVAPORATED METAL FILMS 3 - BACKSCATTERING AND ABSORPTION [J].
COSSLETT, VE ;
THOMAS, RN .
BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (06) :779-&
[8]   THE STUDY OF LOCAL PLASTIC STRAIN IN NICKEL-BASED SUPER-ALLOYS BY SELECTED AREA CHANNELING PATTERNS IN THE STEM [J].
CROMPTON, JS ;
MARTIN, JW .
METALLOGRAPHY, 1980, 13 (03) :225-234
[9]  
Davidson D. L., 1976, Journal of Physics E (Scientific Instruments), V9, P341, DOI 10.1088/0022-3735/9/5/007
[10]   THE EFFECT OF DEFORMATION ON SELECTED AREA ELECTRON CHANNELING PATTERNS [J].
DAVIDSON, DL .
JOURNAL OF MATERIALS SCIENCE LETTERS, 1982, 1 (06) :236-238