VERSATILE THIN-FILM METHOD FOR QUANTITATIVE X-RAY-EMISSION ANALYSIS

被引：17

作者：

CHUNG, FH ^{[1
]}

LENTZ, AJ ^{[1
]}

SCOTT, RW ^{[1
]}

机构：

[1] SHERWIN WILLIAMS RES CTR,CHICAGO,IL 60628

来源：

X-RAY SPECTROMETRY | 1974年 / 3卷 / 04期

关键词：

D O I：

10.1002/xrs.1300030411

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：172 / 175

页数：4

共 11 条

[1]

BIRKS LS, 1959, XRAY SPECTROCHEMICAL, P59

[2]

CLINE JE, 1969, PHYSICAL MEASUREMENT, P83

[3]

CROKE JF, 1967, HDB XRAYS, pCH33

[4]

FINNEGAN JJ, 1962, ADVAN XRAY ANAL, V5, P500

[5] TRACE-ELEMENT DETERMINATION WITH SEMICONDUCTOR DETECTOR X-RAY SPECTROMETERS [J].

GIAUQUE, RD ;

GOULDING, FS ;

JAKLEVIC, JM ;

PEHL, RH .

ANALYTICAL CHEMISTRY, 1973, 45 (04) :671-681

[6] X-RAY FLUORESCENT INTENSITY OF ELEMENTS EVAPORATED FROM SOLUTION ONTO THIN FILM [J].

GUNN, EL .

ANALYTICAL CHEMISTRY, 1961, 33 (07) :921-&

[7]

JENKINS R, 1967, PRACTICAL XRAY SPECT, P21

[8] FILM THICKNESS BY X-RAY EMISSION SPECTROGRAPHY [J].

LIEBHAFSKY, HA ;

ZEMANY, PD .

ANALYTICAL CHEMISTRY, 1956, 28 (04) :455-459

[9] X-RAY EMISSION ANALYSIS OF PAINTS BY THIN FILM METHOD [J].

MCGINNESS, JD ;

SCOTT, RW ;

MORTENSE.JS .

ANALYTICAL CHEMISTRY, 1969, 41 (13) :1858-+

[10]

Muller R. O., 1972, SPECTROCHEMICAL ANAL, P59

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