SIMPLE METHOD OF THIN-FILM ANALYSIS IN ELECTRON-PROBE MICROANALYZER

被引：44
作者：
BISHOP, HE [1 ]
POOLE, DM [1 ]
机构：
[1] ATOM ENERGY RES ESTAB,MAT DEV DIV,HARWELL,ENGLAND
来源：
JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1973年 / 6卷 / 09期
关键词：
D O I：
10.1088/0022-3727/6/9/318
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：1142 / 1158
页数：17
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[3]  
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[6]  
Reuter W., 1972, 6 INT C XRAY OPT MIC, P121
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