SURFACE FLAW DETECTION IN STRUCTURAL CERAMICS BY SCANNING PHOTOACOUSTIC-SPECTROSCOPY

被引：10

作者：

KHANDELWAL, PK ^{[1
]}

HEITMAN, PW ^{[1
]}

SILVERSMITH, AJ ^{[1
]}

WAKEFIELD, TD ^{[1
]}

机构：

[1] GILFORD INSTRUMENT LABS INC,OBERLIN,OH 44074

来源：

APPLIED PHYSICS LETTERS | 1980年 / 37卷 / 09期

关键词：

D O I：

10.1063/1.92071

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：779 / 781

页数：3

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共 9 条

[1] PHOTOACOUSTIC EFFECT WITH THERMALLY THIN SOLIDS
CROWLEY, TP
FAXVOG, FR
ROESSLER, DM
[J]. APPLIED PHYSICS LETTERS, 1980, 36 (08) : 641 - 643
[2] HASSELMAN DPH, 1979, CERAM B, V9, P856
[3] INDENTATION PLASTICITY AND MICROFRACTURE IN SILICON-CARBIDE
LANKFORD, J
DAVIDSON, DL
[J]. JOURNAL OF MATERIALS SCIENCE, 1979, 14 (07) : 1669 - 1675
[4] CRACK-INITIATION THRESHOLD IN CERAMIC MATERIALS SUBJECT TO ELASTIC-PLASTIC INDENTATION
LANKFORD, J
DAVIDSON, DL
[J]. JOURNAL OF MATERIALS SCIENCE, 1979, 14 (07) : 1662 - 1668
[5] HARDNESS, TOUGHNESS, AND BRITTLENESS - INDENTATION ANALYSIS
LAWN, BR
MARSHALL, DB
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1979, 62 (7-8) : 347 - 350
[6] MCGILLEM CD, 1980, CR159865 NASA REP
[7] THEORY OF PHOTOACOUSTIC EFFECT WITH SOLIDS
ROSENCWAIG, A
GERSHO, A
[J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (01) : 64 - 69
[8] PHOTO-ACOUSTIC SPECTROSCOPY OF SOLIDS
ROSENCWAIG, A
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1977, 48 (09) : 1133 - 1137
[9] SUBSURFACE STRUCTURES OF SOLIDS BY SCANNING PHOTOACOUSTIC MICROSCOPY
WONG, YH
THOMAS, RL
POUCH, JJ
[J]. APPLIED PHYSICS LETTERS, 1979, 35 (05) : 368 - 369