SHIELDING CORRECTION TO THE ELECTRICAL MICROFIELD IN A PLASMA AND TO HOLTSMARK THEORY OF LINE BROADENING

被引:29
作者
HOFFMAN, H
THEIMER, O
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D O I
10.1086/146475
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P1 [天文学];
学科分类号
0704 ;
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页码:477 / 486
页数:10
相关论文
共 12 条
[11]   STARK EFFECTS IN LINE BROADENING [J].
MARGENAU, H ;
LEWIS, MB .
PHYSICAL REVIEW, 1957, 106 (02) :244-250
[12]   LINE BROADENING BY ELECTRONS - VALIDITY OF SIMPLE THEORIES [J].
MEYEROTT, RE ;
MARGENAU, H .
PHYSICAL REVIEW, 1955, 99 (06) :1851-1854