SHIELDING CORRECTION TO THE ELECTRICAL MICROFIELD IN A PLASMA AND TO HOLTSMARK THEORY OF LINE BROADENING

被引：29

作者：

HOFFMAN, H

THEIMER, O

机构：

来源：

关键词：

D O I：

10.1086/146475

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

引用

页码：477 / 486

页数：10

共 12 条

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