STRUCTURE OF A-SI1-XCX-H ALLOYS BY WIDE-ANGLE X-RAY-SCATTERING - DETAILED DETERMINATION OF FIRST-SHELL AND 2ND-SHELL ENVIRONMENT FOR SI AND C ATOMS

被引：11
作者：
MENEGHINI, C
BOSCHERINI, F
EVANGELISTI, F
MOBILIO, S
机构：
[1] IST NAZL FIS NUCL,LAB NAZL FRASCATI,I-00044 FRASCATI,ITALY
[2] DIPARTIMENTO FIS,I-00185 ROME,ITALY
[3] UNIV LAQUILA,DIPARTIMENTO ENERGET,I-67100 LAQUILA,ITALY
来源：
PHYSICAL REVIEW B | 1994年 / 50卷 / 16期
关键词：
D O I：
10.1103/PhysRevB.50.11535
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We present a study of the structure of a-Si1-xCx:H alloys by wide-angle x-ray scattering. By carefully analyzing the radial distribution functions and comparing with previous extended x-ray-absorption fine-structure measurements, we provide a detailed and quantitative description of local bonding around Si and C atoms. Among the results presented, most noteworthy are constant interatomic distances in first and second shells and the detection of a strong tendency for chemical order. © 1994 The American Physical Society.
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页码：11535 / 11545
页数：11
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