APPLICATION OF DYNAMIC BACKGROUND SUBTRACTION TO QUANTIFICATION OF AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES

被引：0

作者：

GRANT, JT

HAAS, TW

HOUSTON, JE

机构：

[1] USAF,AEROSP RES LABS,WRIGHT PATTERSON AFB,OH 45433

[2] SANDIA LABS,ALBUQUERQUE,NM 87115

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1974年

关键词：

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：811 / 814

页数：4

共 50 条

[1] COMPARISON OF SOFT-X-RAY AND AUGER-ELECTRON APPEARANCE POTENTIAL SPECTROSCOPY
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