ATOM-RESOLVED SURFACE-CHEMISTRY USING SCANNING TUNNELING MICROSCOPY

被引：308

作者：

WOLKOW, R

AVOURIS, P

机构：

来源：

PHYSICAL REVIEW LETTERS | 1988年 / 60卷 / 11期

关键词：

D O I：

10.1103/PhysRevLett.60.1049

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1049 / 1052

页数：4

共 15 条

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[2]

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[7] A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES [J].

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HAMERS, RJ ;

TROMP, RM ;

WELLAND, ME .

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[8] TUNNELING SPECTROSCOPY OF THE SI(111)2X1 SURFACE [J].

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FEIN, AP .

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[9] IMAGING OF CHEMICAL-BOND FORMATION WITH THE SCANNING TUNNELING MICROSCOPE - NH3 DISSOCIATION ON SI(001) [J].

HAMERS, RJ ;

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BOZSO, F .

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[10]

HAMERS RJ, 1986, PHYS REV LETT, V57, P2979

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