LASING CHARACTERISTICS IN A DEGRADED GAAS-ALXGA1-XAS DOUBLE HETEROSTRUCTURE LASER

被引:32
作者
YONEZU, H [1 ]
UENO, M [1 ]
KAMEJIMA, T [1 ]
SAKUMA, I [1 ]
机构
[1] NIPPON ELECT CO LTD,CENT RES LABS,NAKAHARA,KAWASAKI,JAPAN
关键词
D O I
10.1143/JJAP.13.835
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:835 / 842
页数:8
相关论文
共 16 条
[1]   ETCHING OF DISLOCATIONS ON LOW-INDEX FACES OF GAAS [J].
ABRAHAMS, MS ;
BUIOCCHI, CJ .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (09) :2855-&
[2]   VARIATION OF MINORITY-CARRIER DIFFUSION LENGTH WITH CARRIER CONCENTRATION IN GAAS LIQUID-PHASE EPITAXIAL LAYERS [J].
CASEY, HC ;
MILLER, BI ;
PINKAS, E .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (03) :1281-1287
[3]   OBSERVATIONS OF INDIVIDUAL DISLOCATIONS AND OXYGEN PRECIPITATES IN SILICON WITH A SCANNING ELECTRON BEAM METHOD [J].
CZAJA, W ;
PATEL, JR .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (04) :1476-&
[4]   DEGRADATION OF CW GAAS DOUBLE-HETEROJUNCTION LASERS AT 300-K [J].
DELOACH, BC ;
HAKKI, BW ;
HARTMAN, RL ;
DASARO, LA .
PROCEEDINGS OF THE IEEE, 1973, 61 (07) :1042-1044
[5]   CW DEGRADATION AT 300 DEGREES K OF GAAS DOUBLE-HETEROSTRUCTURE JUNCTION LASERS .2. ELECTRONIC GAIN [J].
HAKKI, BW ;
PAOLI, TL .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (09) :4113-4119
[6]   DEGRADATION CHARACTERISTICS OF CW OPTICALLY PUMPED ALXGA1-XAS HETEROSTRUCTURE LASERS [J].
JOHNSTON, WD ;
MILLER, BI .
APPLIED PHYSICS LETTERS, 1973, 23 (04) :192-194
[7]   REPRODUCIBLE LIQUID-PHASE-EPITAXIAL GROWTH OF DOUBLE HETEROSTRUCTURE GAAS-ALXGA1-XAS LASER-DIODES [J].
MILLER, BI ;
CAPIK, RJ ;
HAYASHI, I ;
PINKAS, E .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (06) :2817-&
[8]  
NEWMAN DH, 1972, IEEE J QUANTUM ELECT, VQE 8, P379
[9]   CW DEGRADATION AT 300 DEGREES K OF GAAS DOUBLE-HETEROSTRUCTURE JUNCTION LASERS .1. EMISSION-SPECTRA [J].
PAOLI, TL ;
HAKKI, BW .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (09) :4108-4112
[10]   DEFECT STRUCTURE INTRODUCED DURING OPERATION OF HETEROJUNCTION GAAS LASERS [J].
PETROFF, P ;
HARTMAN, RL .
APPLIED PHYSICS LETTERS, 1973, 23 (08) :469-471