PRACTICAL ELECTRON SPECTROMETER FOR CHEMICAL-ANALYSIS

被引:15
作者
JOY, DC
MAHER, DM
机构
来源
JOURNAL OF MICROSCOPY-OXFORD | 1978年 / 114卷 / NOV期
关键词
D O I
10.1111/j.1365-2818.1978.tb00124.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
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页码:117 / 129
页数:13
相关论文
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