APPLICATION OF BACKSCATTER KIKUCHI DIFFRACTION IN THE SCANNING ELECTRON-MICROSCOPE TO THE STUDY OF NIS2

被引：20

作者：

BABAKISHI, KZ ^{[1
]}

DINGLEY, DJ ^{[1
]}

机构：

[1] UNIV BRISTOL,HH WILLS PHYS LAB,BRISTOL BS8 1TL,AVON,ENGLAND

来源：

关键词：

D O I：

10.1107/S0021889888013342

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：189 / 200

页数：12

共 11 条

[1]

BABAKISHI K, 1986, 11TH P INT C EL MICR, P741

[2]

BABAKISHI KZ, 1987, MICROANALYSIS HIGH S

[3]

BABAKISHI KZ, 1987, I PHYS C SER, V90, P135

[4]

Cullity B.D, 1959, XRAY DIFFRACTION, Vsecond

[5]

DINGLEY DJ, 1981, I PHYS C SERIES, V61, P541

[6]

DINGLEY DJ, 1986, 11 P INT C EL MICR K, P753

[7]

DINGLEY DJ, 1986, SCANNING ELECTRON MI, V2, P383

[8]

Faktor M.M., 1974, GROWTH CRYSTALS VAPO

[9]

Rao C. N. R., 1976, PROGR SOLID STATE CH, V10, P207, DOI DOI 10.1016/0079-6786(76)90009-1

Trahan, Jeffrey ;

Goodrich, R. G. ;

Watkins, S. F. .

PHYSICAL REVIEW B-SOLID STATE, 1970, 2 (08) :2859-2863