FAULT COVERAGE REQUIREMENT IN PRODUCTION TESTING OF LSI CIRCUITS

被引：45

作者：

AGRAWAL, VD ^{[1
]}

SETH, SC ^{[1
]}

AGRAWAL, P ^{[1
]}

机构：

[1] UNIV NEBRASKA,DEPT COMP SCI,LINCOLN,NE 68588

来源：

关键词：

D O I：

10.1109/JSSC.1982.1051686

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：57 / 60

页数：4

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[5]

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[7]

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[8]

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