HARDWARE VS SOFTWARE-RELIABILITY - A COMPARATIVE-STUDY

被引：4

作者：

SOI, IM

GOPAL, K

机构：

来源：

MICROELECTRONICS AND RELIABILITY | 1980年 / 20卷 / 06期

关键词：

D O I：

10.1016/0026-2714(80)90012-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：881 / 885

页数：5

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