STRUCTURAL CHARACTERIZATION OF MONOLAYERS AT THE AIR-WATER-INTERFACE

被引：35

作者：

MOBIUS, D

MOHWALD, H

机构：

[1] MAX PLANCK INST BIOPHYS CHEM,W-3400 GOTTINGEN,GERMANY

[2] UNIV MAINZ,INST PHYS CHEM,W-6500 MAINZ,GERMANY

来源：

ADVANCED MATERIALS | 1991年 / 3卷 / 01期

关键词：

X-RAY DIFFRACTION; FLUORESCENCE MICROSCOPY; REFLECTION SPECTROSCOPY; DOMAIN STRUCTURES;

D O I：

10.1002/adma.19910030104

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Review: X‐Ray diffraction, fluorescence microscopy, and reflection spectroscopy, are all methods used for the characterization of organic thin films which enable the study of, for example, dipole layers, domain structures, mechanical surface excitations, and the orientation of the hydrocarbon ‘tails’. The methods and their applications, especially in the optimization of monolayer formation and transfer, are reviewed. Copyright © 1991 Verlag GmbH & Co. KGaA, Weinheim

引用

页码：19 / 24

页数：6

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