SINGLE-ELECTRON TUNNELING OBSERVED AT ROOM-TEMPERATURE BY SCANNING-TUNNELING MICROSCOPY

被引:113
作者
SCHONENBERGER, C
VANHOUTEN, H
DONKERSLOOT, HC
机构
[1] Philips Research Laboratories, Eindhoven, 5600
来源
EUROPHYSICS LETTERS | 1992年 / 20卷 / 03期
关键词
D O I
10.1209/0295-5075/20/3/010
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Ultrasmall (less-than-or-similar-to 5 nm in lateral diameter) double-barrier tunnel junctions have been realized using a scanning tunnelling microscope, and an optimized metal particle-oxide-metallic substrate system. Three electrical transport effects, all in good agreement with the semi-classical theory of single-electron tunnelling, have been found at room temperature: the Coulomb gap, the Coulomb staircase and zero-bias conductance oscillations as a function of tip-particle distance.
引用
收藏
页码:249 / 254
页数:6
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