DESIGN AND PERFORMANCE OF THE CM20 FEG FIELD-EMISSION TEM

被引：2
作者：
OTTEN, MT
MUL, PM
DEJONG, MJC
机构：
来源：
MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1992年 / 3卷 / 01期
关键词：
D O I：
10.1051/mmm:019920030108300
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：83 / 92
页数：10
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