SCANNING TUNNELING MICROSCOPY STUDIES ON AU/SI(111) INTERFACES

被引：19

作者：

DUMAS, P

HUMBERT, A

MATHIEU, G

MATHIEZ, P

MOUTTET, C

ROLLAND, R

SALVAN, F

THIBAUDAU, F

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575371

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：517 / 518

页数：2

共 6 条

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[3] REAL-SPACE DETERMINATION OF ATOMIC-STRUCTURE OF THE SI(111)-SQUARE-ROOT-3 X SQUARE-ROOT-3 R 30-DEGREES-AU SURFACE BY LOW-ENERGY ALKALI-ION SCATTERING [J].

OURA, K ;

KATAYAMA, M ;

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HANAWA, T .

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[4] AU/SI(111) OVERLAYER - CHARACTERIZATION BY TUNNELING MICROSCOPY AND SPECTROSCOPY [J].

SALVAN, F ;

FUCHS, H ;

BARATOFF, A ;

BINNIG, G .

SURFACE SCIENCE, 1985, 162 (1-3) :634-639

[5] LOCAL ELECTRON-STATES AND SURFACE GEOMETRY OF SI(111)-(SQUARE-ROOT 3 X SQUARE-ROOT 3)AG [J].

VANLOENEN, EJ ;

DEMUTH, JE ;

TROMP, RM ;

HAMERS, RJ .

PHYSICAL REVIEW LETTERS, 1987, 58 (04) :373-376

[6] STRUCTURE OF THE AG/SI(111) SURFACE BY SCANNING TUNNELING MICROSCOPY [J].

WILSON, RJ ;

CHIANG, S .

PHYSICAL REVIEW LETTERS, 1987, 58 (04) :369-372

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