SPHERICAL WAVE EXAFS ANALYSIS OF THE SILICON K-EDGE X-RAY ABSORPTION-SPECTRUM

被引：14
作者：
DICICCO, A [1 ]
BIANCONI, A [1 ]
PAVEL, NV [1 ]
机构：
[1] UNIV ROME LA SAPIENZA,DEPARTIMENTO CHIM,I-00185 ROME,ITALY
来源：
SOLID STATE COMMUNICATIONS | 1987年 / 61卷 / 10期
关键词：
D O I：
10.1016/0038-1098(87)90377-2
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：635 / 639
页数：5
相关论文
共 26 条
  • [1] VIBRATIONAL AMPLITUDES IN GERMANIUM AND SILICON
    BATTERMAN, BW
    CHIPMAN, DR
    [J]. PHYSICAL REVIEW, 1962, 127 (03): : 690 - &
  • [2] BAUER RS, 1978, I PHYS C SER, V43, P797
  • [3] MULTIPLE-SCATTERING REGIME AND HIGHER-ORDER CORRELATIONS IN X-RAY-ABSORPTION SPECTRA OF LIQUID SOLUTIONS
    BENFATTO, M
    NATOLI, CR
    BIANCONI, A
    GARCIA, J
    MARCELLI, A
    FANFONI, M
    DAVOLI, I
    [J]. PHYSICAL REVIEW B, 1986, 34 (08): : 5774 - 5781
  • [4] PROBING HIGHER-ORDER CORRELATION-FUNCTIONS IN LIQUIDS BY XANES (X-RAY ABSORPTION NEAR EDGE STRUCTURE)
    BIANCONI, A
    GARCIA, J
    MARCELLI, A
    BENFATTO, M
    NATOLI, CR
    DAVOLI, I
    [J]. JOURNAL DE PHYSIQUE, 1985, 46 (C-9): : 101 - 106
  • [5] EVIDENCE OF SIO AT THE SI-OXIDE INTERFACE BY SURFACE SOFT-X-RAY ABSORPTION NEAR EDGE SPECTROSCOPY
    BIANCONI, A
    [J]. SURFACE SCIENCE, 1980, 99 (01) : 76 - 86
  • [6] BIANCONI A, IN PRESS
  • [7] APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES
    BRUNDLE, CR
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 212 - 224
  • [8] DICICCO A, 1986, J PHYS
  • [9] 3-PARTICLE CORRELATION-FUNCTION OF METAL-IONS IN TETRAHEDRAL COORDINATION DETERMINED BY XANES
    GARCIA, J
    BENFATTO, M
    NATOLI, CR
    BIANCONI, A
    DAVOLI, I
    MARCELLI, A
    [J]. SOLID STATE COMMUNICATIONS, 1986, 58 (09) : 595 - 599
  • [10] A RAPID, EXACT CURVED-WAVE THEORY FOR EXAFS CALCULATIONS
    GURMAN, SJ
    BINSTED, N
    ROSS, I
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (01): : 143 - 151
123