X-RAY-DIFFRACTION ON MICROCRYSTALS WITH SYNCHROTRON RADIATION

被引：3

作者：

RIECK, W

SCHULZ, H

SIEDEL, M

机构：

[1] Institut f:ur Kristallographie und Mineralogie, Universität München, D-8000 München 2

来源：

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 1991年 / 52卷 / 10期

关键词：

ABSORPTION; BACKGROUND; COUNTER; DATA COLLECTION; DETECTOR; DIFFRACTION; DIFFRACTOMETER; DIVERGENCE; EXTINCTION; INTENSITY; KINEMATICAL THEORY; MICROCRYSTAL; ORIENTATION (OF CRYSTALS); PREPARATION; SCATTERING POWER; SIZE (OF CRYSTALS); SYNCHROTRON RADIATION; WIGGLER;

D O I：

10.1016/0022-3697(91)90205-E

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Very small single crystals were used for X-ray diffraction experiments with synchrotron radiation. From such micro-crystals data sets are expected that are nearly free from systematic errors as e.g. extinction or absorption. A CaF2 crystal with a volume of 2.2-mu-m3 was mounted on a glass capillary. It was oriented and its reflections were measured in the 1.56 angstrom focused synchrotron radiation beam of a six-pole wiggler.

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页码：1289 / 1291

页数：3

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