THE EFFECT OF OXYGEN IN DIAMOND DEPOSITION BY MICROWAVE PLASMA ENHANCED CHEMICAL VAPOR-DEPOSITION

被引:139
作者
LIOU, Y
INSPEKTOR, A
WEIMER, R
KNIGHT, D
MESSIER, R
机构
[1] NATL SUN YAT SEN UNIV,KAU SHUNG,TAIWAN
[2] NUCL RES CTR NEGEV,IL-84190 BEER SHEVA,ISRAEL
关键词
D O I
10.1557/JMR.1990.2305
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
High quality diamond thin films were deposited on different substrates at temperatures from 300 to 1000 °C by the microwave plasma enhanced chemical vapor deposition (MPCVD) system. The quality of deposited diamond films was improved by adding oxygen in the gas mixtures. Different ratios of methane to oxygen concentration in hydrogen at different temperatures have been studied. At high temperatures (800–1000 °C), the addition of oxygen will not only enhance the growth rate of deposited films but also extend the region of diamond formation. At low temperatures (<500 °C), the oxygen plays an important role in diamond film growth by preferentially etching the non-diamond carbon. Without the addition of oxygen, the films deposited at high temperatures (>900 °C) were either graphitic or diamond containing a large amount of graphitic or amorphous carbon and at low temperatures (<500 °C) were white, soot-like coatings which were easily scraped off. The quality of the deposited films was characterized by Raman spectroscopy and scanning electron microscopy. © 1990, Materials Research Society. All rights reserved.
引用
收藏
页码:2305 / 2312
页数:8
相关论文
共 50 条
[41]   Nitrogen effect on the diamond deposition processing by 915-MHz microwave plasma enhanced chemical vapor deposition reactor [J].
Tsai, Hung-Yin ;
Kuo, Kei-Lin .
Journal of the Chinese Society of Mechanical Engineers, Transactions of the Chinese Institute of Engineers, Series C/Chung-Kuo Chi Hsueh Kung Ch'eng Hsuebo Pao, 2007, 28 (02) :157-162
[42]   MICROSTRUCTURES OF DIAMOND FORMED BY PLASMA ASSISTED CHEMICAL VAPOR-DEPOSITION [J].
KAAE, JL ;
GANTZEL, PK ;
CHIN, J ;
WEST, WP .
CARBON, 1990, 28 (06) :803-803
[43]   TRIBOLOGICAL PROPERTIES OF DIAMOND FILMS GROWN BY PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITION [J].
WONG, MS ;
MEILUNAS, R ;
ONG, TP ;
CHANG, RPH .
APPLIED PHYSICS LETTERS, 1989, 54 (20) :2006-2008
[44]   HYDROGEN-ETCHING EFFECT OF SUBSTRATE ON DEPOSITION OF DIAMOND FILMS BY DC PLASMA CHEMICAL VAPOR-DEPOSITION [J].
NAKAO, S ;
NODA, M ;
WATATANI, H ;
MARUNO, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1991, 30 (7A) :L1195-L1198
[45]   THE DEPOSITION OF INSULATORS ON INP USING PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITION [J].
JONES, GR ;
CAMERON, DC ;
IRVING, LD ;
WOODWARD, J .
THIN SOLID FILMS, 1981, 80 (1-3) :241-241
[46]   THE DEPOSITION RATE AND PROPERTIES OF THE DEPOSIT IN PLASMA ENHANCED CHEMICAL VAPOR-DEPOSITION OF TIN [J].
JANG, DH ;
CHUN, JS ;
KIM, JG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (01) :31-35
[47]   DEPOSITION OF THIN RHODIUM FILMS BY PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITION [J].
ETSPULER, A ;
SUHR, H .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1989, 48 (04) :373-375
[48]   DOWNSTREAM MICROWAVE PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITION OF OXIDE USING TETRAETHOXYSILANE [J].
PAI, CS ;
CHANG, CP .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (02) :793-801
[49]   ELECTROSTATIC-PROBE MEASUREMENTS FOR MICROWAVE PLASMA-ASSISTED CHEMICAL VAPOR-DEPOSITION OF DIAMOND [J].
CERIO, FM ;
WEIMER, WA .
APPLIED PHYSICS LETTERS, 1991, 59 (26) :3387-3389
[50]   CATHODOLUMINESCENCE PROPERTIES OF DIAMOND FILMS SYNTHESIZED BY MICROWAVE-PLASMA-ASSISTED CHEMICAL VAPOR-DEPOSITION [J].
MURANAKA, Y ;
YAMASHITA, H ;
MIYADERA, H .
THIN SOLID FILMS, 1991, 199 (02) :299-311