IMPACT IONIZATION IN GAAS - DISTRIBUTION OF FINAL ELECTRON-STATES DETERMINED FROM HYDROSTATIC-PRESSURE MEASUREMENTS

被引:12
作者
ALLAM, J
ADAMS, AR
PATE, MA
ROBERTS, JS
机构
[1] UNIV SHEFFIELD,DEPT ELECTR & ELECT ENGN,SHEFFIELD S1 3JD,S YORKSHIRE,ENGLAND
[2] HITACHI EUROPE LTD,HITACHI CAMBRIDGE LAB,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND
关键词
D O I
10.1063/1.115228
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have measured the avalanche breakdown voltage (V-b) in GaAs p-i-n diodes as a function of hydrostatic pressure up to 14 kbar. The pressure coefficient of V-b was Small and opposite in sign compared to that of the band gap. A lucky-drift calculation of V-b including the effects of pressure on both the phonon scattering and ionization rates showed that the ionization threshold energy does not scale with the band gap. Instead, the effective threshold scales with an average of the energies of the Gamma, X, and L conduction-band minima. This is direct evidence that pair production yields final electron states distributed between conduction-band valleys. (C) 1995 American Institute of Physics.
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页码:3304 / 3306
页数:3
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