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VERY THIN SILICON-NITRIDE FILMS GROWN BY DIRECT THERMAL-REACTION WITH NITROGEN
被引:91
作者
:
ITO, T
论文数:
0
引用数:
0
h-index:
0
ITO, T
HIJIYA, S
论文数:
0
引用数:
0
h-index:
0
HIJIYA, S
NOZAKI, T
论文数:
0
引用数:
0
h-index:
0
NOZAKI, T
ARAKAWA, H
论文数:
0
引用数:
0
h-index:
0
ARAKAWA, H
SHINODA, M
论文数:
0
引用数:
0
h-index:
0
SHINODA, M
FUKUKAWA, Y
论文数:
0
引用数:
0
h-index:
0
FUKUKAWA, Y
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1978年
/ 125卷
/ 03期
关键词
:
D O I
:
10.1149/1.2131471
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:448 / 452
页数:5
相关论文
共 11 条
[1]
DIRECT NITRIDATION OF SILICON SUBSTRATES
FRIESER, RG
论文数:
0
引用数:
0
h-index:
0
FRIESER, RG
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(10)
: 1092
-
&
[2]
HEUMANN FK, 1968, J ELECTROCHEM SOC, V115, P331
[3]
QUANTITATIVE DETECTION OF OXYGEN IN SILICON-NITRIDE ON SILICON
HOLLOWAY, PH
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HOLLOWAY, PH
STEIN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
STEIN, HJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(05)
: 723
-
728
[4]
PROPERTIES OF AMORPHOUS SILICON NITRIDE FILMS
HU, SM
论文数:
0
引用数:
0
h-index:
0
HU, SM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(07)
: 693
-
+
[5]
STUDY OF CHEMICAL COMPOSITION OF MOS AND MNOS STRUCTURES BY AUGER-ELECTRON SPECTROSCOPY
JOHANNESSEN, JS
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,ELECTR LABS,STANFORD,CA 94305
JOHANNESSEN, JS
SPICER, WE
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,ELECTR LABS,STANFORD,CA 94305
SPICER, WE
STRAUSSER, YE
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,ELECTR LABS,STANFORD,CA 94305
STRAUSSER, YE
[J].
THIN SOLID FILMS,
1976,
32
(02)
: 311
-
314
[6]
KNOOP AN, 1965, ELECTROCHEM TECHNOL, V3, P84
[7]
FORMATION OF SILICON-NITRIDE AT A SI-SIO2 INTERFACE DURING LOCAL OXIDATION OF SILICON AND DURING HEAT-TREATMENT OF OXIDIZED SILICON IN NH3 GAS
KOOI, E
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
KOOI, E
VANLIEROP, JG
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
VANLIEROP, JG
APPELS, JA
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
APPELS, JA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(07)
: 1117
-
1120
[8]
NITROGEN REACTION AT A SILICON-SILICON DIOXIDE INTERFACE
RAIDER, SI
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
RAIDER, SI
GDULA, RA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
GDULA, RA
PETRAK, JR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
PETRAK, JR
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(03)
: 150
-
152
[9]
CHARACTERIZATION OF SILICON NITRIDE FILMS
TAFT, EA
论文数:
0
引用数:
0
h-index:
0
TAFT, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(08)
: 1341
-
&
[10]
NITROGEN-SILICON REACTION AND ITS INFLUENCE ON DIELECTRIC STRENGTH OF THERMAL SILICON DIOXIDE
VROMEN, BH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
VROMEN, BH
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(03)
: 152
-
154
←
1
2
→
共 11 条
[1]
DIRECT NITRIDATION OF SILICON SUBSTRATES
FRIESER, RG
论文数:
0
引用数:
0
h-index:
0
FRIESER, RG
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(10)
: 1092
-
&
[2]
HEUMANN FK, 1968, J ELECTROCHEM SOC, V115, P331
[3]
QUANTITATIVE DETECTION OF OXYGEN IN SILICON-NITRIDE ON SILICON
HOLLOWAY, PH
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HOLLOWAY, PH
STEIN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
STEIN, HJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(05)
: 723
-
728
[4]
PROPERTIES OF AMORPHOUS SILICON NITRIDE FILMS
HU, SM
论文数:
0
引用数:
0
h-index:
0
HU, SM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(07)
: 693
-
+
[5]
STUDY OF CHEMICAL COMPOSITION OF MOS AND MNOS STRUCTURES BY AUGER-ELECTRON SPECTROSCOPY
JOHANNESSEN, JS
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,ELECTR LABS,STANFORD,CA 94305
JOHANNESSEN, JS
SPICER, WE
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,ELECTR LABS,STANFORD,CA 94305
SPICER, WE
STRAUSSER, YE
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,ELECTR LABS,STANFORD,CA 94305
STRAUSSER, YE
[J].
THIN SOLID FILMS,
1976,
32
(02)
: 311
-
314
[6]
KNOOP AN, 1965, ELECTROCHEM TECHNOL, V3, P84
[7]
FORMATION OF SILICON-NITRIDE AT A SI-SIO2 INTERFACE DURING LOCAL OXIDATION OF SILICON AND DURING HEAT-TREATMENT OF OXIDIZED SILICON IN NH3 GAS
KOOI, E
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
KOOI, E
VANLIEROP, JG
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
VANLIEROP, JG
APPELS, JA
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
APPELS, JA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(07)
: 1117
-
1120
[8]
NITROGEN REACTION AT A SILICON-SILICON DIOXIDE INTERFACE
RAIDER, SI
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
RAIDER, SI
GDULA, RA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
GDULA, RA
PETRAK, JR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
PETRAK, JR
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(03)
: 150
-
152
[9]
CHARACTERIZATION OF SILICON NITRIDE FILMS
TAFT, EA
论文数:
0
引用数:
0
h-index:
0
TAFT, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(08)
: 1341
-
&
[10]
NITROGEN-SILICON REACTION AND ITS INFLUENCE ON DIELECTRIC STRENGTH OF THERMAL SILICON DIOXIDE
VROMEN, BH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
IBM CORP,SYST PROD DIV,E FISHKILL,HOPEWELL JUNCTION,NY 12533
VROMEN, BH
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(03)
: 152
-
154
←
1
2
→