BUNCH-PURITY MEASUREMENTS OF SYNCHROTRON X-RAY-BEAMS WITH AN AVALANCHE PHOTODIODE DETECTOR

被引：14

作者：

KISHIMOTO, S

机构：

[1] Photon Factory, National Laboratory for High Energy Physics, Tsukuba, Ibaraki

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 351卷 / 2-3期

关键词：

D O I：

10.1016/0168-9002(94)91385-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The bunch purity of synchrotron X-ray beams has been measured with an avalanche photodiode (APD) detector. The APD detector has several advantages for measurements of the bunch structure in a storage ring: the detector has a good time resolution of 100 ps (FWHM) and very low noise level. Moreover, the peak profile by the present APD device has only a short tail, or a full width of 1.4 ns at 10(-5) maximum, so that a small peak adjacent, 2 ns apart, to the main peak can be clearly resolved in the bunch structure. A successful measurement of the purity between the main and second bunches of the order of 10(-9) is reported.

引用

页码：554 / 558

页数：5

共 13 条

[1]

HARBEKE G, 1989, SEMICONDUCTOR SILICO, P20

[2]

ISHIKAWA Y, COMMUNICATION

[3] INCREASE IN IMPURITY IN SINGLE BUNCH MODE OF UVSOR STORAGE RING [J].