TOPOTACTICALLY ORIENTED ALPHA-SI3N4 CORES IN SINTERED BETA-SI3N4

被引:9
|
作者
KRAMER, M
机构
[1] Max-Planck Institute for Metal Research, Institute of Materials Science, PML, Stuttgart
关键词
D O I
10.1111/j.1151-2916.1993.tb03954.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Alpha-Si3N4 core structures within beta-Si3N4 grains have been studied by transmission electron microscopy. The grains were dispersed in an oxynitride glass which was previously melted at 1600-degrees-C. The cores were topotactically related to the as-grown beta-Si3N4 crystallites and are related to epitactical nucleation during heat treatment as the most probable mechanism.
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页码:1627 / 1629
页数:3
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