STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY - REPLY

被引：12

作者：

BATSTONE, JL ^{[1
]}

PHILLIPS, JM ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

PHYSICAL REVIEW LETTERS | 1988年 / 61卷 / 19期

关键词：

D O I：

10.1103/PhysRevLett.61.2275

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：2275 / 2275

页数：1

共 8 条

[1] EVIDENCE FOR THE INFLUENCE OF INTERFACIAL ATOMIC-STRUCTURE ON ELECTRICAL-PROPERTIES AT THE EPITAXIAL CAF2/SI(111) INTERFACE [J].

BATSTONE, JL ;

PHILLIPS, JM ;

HUNKE, EC .

PHYSICAL REVIEW LETTERS, 1988, 60 (14) :1394-1397

[2]

BATSTONE JL, 1988, MATER RES SOC S P, V102, P45

[3] ATOMIC-STRUCTURE OF THE NISI2/(111)SI INTERFACE [J].

CHERNS, D ;

ANSTIS, GR ;

HUTCHISON, JL ;

SPENCE, JCH .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (05) :849-862

[4] THE ATOMIC-STRUCTURE OF THE NISI2-(001)SI INTERFACE [J].

CHERNS, D ;

HETHERINGTON, CJD ;

HUMPHREYS, CJ .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1984, 49 (01) :165-177

[5]

GIBSON JM, 1982, APPL PHYS LETT, V41, P818, DOI 10.1063/1.93699

[6] PHOTOEMISSION-STUDY OF BONDING AT THE CAF2-ON-SI(111) INTERFACE [J].

OLMSTEAD, MA ;

UHRBERG, RIG ;

BRINGANS, RD ;

BACHRACH, RZ .

PHYSICAL REVIEW B, 1987, 35 (14) :7526-7532

[7] STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY [J].

TROMP, RM ;

LEGOUES, FK ;

KRAKOW, W ;

SCHOWALTER, LJ .

PHYSICAL REVIEW LETTERS, 1988, 61 (19) :2274-2274

[8] STRUCTURE OF THE SI(111)-CAF2 INTERFACE [J].

TROMP, RM ;

REUTER, MC .

PHYSICAL REVIEW LETTERS, 1988, 61 (15) :1756-1759

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