MEASUREMENT OF LOCAL THICKNESS BY ELECTRON ENERGY-LOSS SPECTROSCOPY

被引：134
作者：
EGERTON, RF
CHENG, SC
机构：
[1] Univ of Alberta, Edmonton, Alberta,, Can, Univ of Alberta, Edmonton, Alberta, Can
来源：
ULTRAMICROSCOPY | 1987年 / 21卷 / 03期
关键词：
We thank Dr. P.A. Crozier and Dr. S.S. Sheinin for a number of interesting and useful discussions. and the Natural Sciences and Engineering Research Council of Canada for supporting analytical electron microscopy at the University of Alberta;
D O I：
10.1016/0304-3991(87)90148-3
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
36
引用
收藏
页码：231 / 244
页数：14
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