MEASUREMENT OF LOCAL THICKNESS BY ELECTRON ENERGY-LOSS SPECTROSCOPY

被引：134

作者：

EGERTON, RF

CHENG, SC

机构：

[1] Univ of Alberta, Edmonton, Alberta,, Can, Univ of Alberta, Edmonton, Alberta, Can

来源：

ULTRAMICROSCOPY | 1987年 / 21卷 / 03期

关键词：

We thank Dr. P.A. Crozier and Dr. S.S. Sheinin for a number of interesting and useful discussions. and the Natural Sciences and Engineering Research Council of Canada for supporting analytical electron microscopy at the University of Alberta;

D O I：

10.1016/0304-3991(87)90148-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：231 / 244

页数：14

共 36 条

[1] METHODS FOR SPECIMEN THICKNESS DETERMINATION IN ELECTRON-MICROSCOPY [J].

BERRIMAN, J ;

BRYAN, RK ;

FREEMAN, R ;

LEONARD, KR .

ULTRAMICROSCOPY, 1984, 13 (04) :351-364

[2] APPARENT DENSITY OF THIN EVAPORATED FILMS [J].

BLOIS, MS ;

RIESER, LM .

JOURNAL OF APPLIED PHYSICS, 1954, 25 (03) :338-340

[3] MEASUREMENT OF FOIL THICKNESS AND EXTINCTION DISTANCE BY CONVERGENT BEAM TRANSMISSION ELECTRON-MICROSCOPY [J].

CASTROFERNANDEZ, FR ;

SELLARS, CM ;

WHITEMAN, JA .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1985, 52 (03) :289-303

[4] ELECTRON-ENERGY LOSSES IN SILICON - BULK AND SURFACE PLASMONS AND CERENKOV RADIATION [J].

CHEN, CH ;

SILCOX, J ;

VINCENT, R .

PHYSICAL REVIEW B, 1975, 12 (01) :64-71

[5]

CHENG SC, 1987, THESIS U ALBERTA

[6]

CHOPRA KL, 1969, THIN FILM PHENOMENA, P189

[7] ANALYSIS OF ELECTRON-EXCITATION SPECTRA IN HEAVY RARE-EARTH METALS, HYDRIDES AND OXIDES [J].

COLLIEX, C ;

GASGNIER, M ;

TREBBIA, P .

JOURNAL DE PHYSIQUE, 1976, 37 (04) :397-406

[8]

CROZIER PA, 1986, 44TH P ANN EMSA M AL, P714

[9]

Daniels J., 1970, SPRINGER TRACTS MODE, V54, P77

[10] FOURIER DECONVOLUTION OF ELECTRON ENERGY-LOSS SPECTRA [J].

EGERTON, RF ;

WILLIAMS, BG ;

SPARROW, TG .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1985, 398 (1815) :395-404

← 1 2 3 4 →