DEFECT STRUCTURES OF LANGMUIR-BLODGETT-FILMS INVESTIGATED BY SCANNING FORCE MICROSCOPY

被引：29
|
作者：
FUCHS, H
CHI, LF
ENG, LM
GRAF, K
机构：
[1] BASF AG, Polymer Research Laboratory, D-W6700 Ludwigshafen
来源：
THIN SOLID FILMS | 1992年 / 210卷 / 1-2期
关键词：
D O I：
10.1016/0040-6090(92)90366-J
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We applied scanning force microscopy (SFM) to investigate the surface morphology of Langmuir-Blodgett (LB) films, their intrinsic defect structures as well as film defects induced by the imaging process itself. Molecular resolution was routinely obtained on intact areas of Cd-arachidate multilayer films over areas of 20 x 20 nm2. On a larger scale, monomeric films show film terraces and pinhole defects. Furthermore, the time dependent growth of the pinhole-like structures as well as the influence of the polymerization process in diynoic multilayer films was directly observed.
引用
收藏
页码：655 / 658
页数：4
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