MOLECULAR-DYNAMICS SIMULATION OF AMORPHOUS AND EPITAXIAL SI FILM GROWTH ON SI(111)

被引:66
作者
KWON, I
BISWAS, R
GREST, GS
SOUKOULIS, CM
机构
[1] IOWA STATE UNIV SCI & TECHNOL,DEPT PHYS,AMES,IA 50011
[2] IOWA STATE UNIV SCI & TECHNOL,MICROELECTR RES CTR,AMES,IA 50011
[3] EXXON RES & ENGN CO,CORP RES SCI LAB,ANNANDALE,NJ 08801
来源
PHYSICAL REVIEW B | 1990年 / 41卷 / 06期
关键词
D O I
10.1103/PhysRevB.41.3678
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Both amorphous and epitaxial crystalline Si films have been grown by deposition of Si-atom clusters on a Si(111) substrate with molecular-dynamics simulations utilizing two- and three-body interatomic Si potentials. The amorphous films were produced with deposition conditions that led to low surface diffusion. The a-Si films displayed voids, a 1528 % lower density than c-Si, and coordination defects consisting only of undercoordinated atoms with no fivefold-coordinated atoms, in contrast to melt-quenched a-Si models. The epitaxial Si(111) growth was achieved under conditions of high surface diffusion consisting of a large initial cluster velocity and moderate substrate temperatures. © 1990 The American Physical Society.
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收藏
页码:3678 / 3687
页数:10
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