CHARACTERIZATION OF OXIDE SUPERCONDUCTOR BY MEANS OF X-RAY-DIFFRACTOMETRY AND X-RAY ABSORPTION NEAR EDGE STRUCTURE

被引：4

作者：

KIMURA, M

MATSUO, M

MURAKAMI, M

SAWANO, K

MATSUDA, S

机构：

来源：

ISIJ INTERNATIONAL | 1989年 / 29卷 / 03期

关键词：

D O I：

10.2355/isijinternational.29.213

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：213 / 222

页数：10

共 28 条

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