RADIATION-DAMAGE TEST OF SILICON MULTISTRIP DETECTORS

被引：22

作者：

NAKAMURA, M ^{[1
]}

TOMITA, Y ^{[1
]}

NIWA, K ^{[1
]}

KONDO, T ^{[1
]}

机构：

[1] KEK,NATL LAB HIGH ENERGY PHYS,IBARAKI 304,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1988年 / 270卷 / 01期

关键词：

D O I：

10.1016/0168-9002(88)90007-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：42 / 55

页数：14

共 50 条

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