C-60 ENCAPSULATION OF THE SI(111)-(7X7) SURFACE

被引：32

作者：

HONG, HW

MCMAHON, WE

ZSCHACK, P

LIN, DS

ABURANO, RD

CHEN, H

CHIANG, TC

机构：

[1] UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA

[2] UNIV ILLINOIS, DEPT MAT SCI & ENGN, URBANA, IL 61801 USA

[3] UNIV ILLINOIS, DEPT PHYS, URBANA, IL 61801 USA

[4] OAK RIDGE NATL LAB, DIV MET & CERAM, OAK RIDGE, TN 37831 USA

来源：

APPLIED PHYSICS LETTERS | 1992年 / 61卷 / 26期

关键词：

D O I：

10.1063/1.107982

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The structure of a Si(111)-(7 X 7) surface capped by a 200 angstrom film of C60 was studied by grazing-incidence x-ray diffraction. The Si(111)-(7 X 7) reconstruction prepared in vacuum, including the loosely bonded ''adatoms'' on the surface, is preserved under the C60 overlayer. This result illustrates that C60 can be used as an inert cap for surfaces and suggests potentially interesting applications in surface science research and electronic device engineering.

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页码：3127 / 3129

页数：3

相关论文

共 12 条

[1] INTERFACIAL SUPERSTRUCTURES STUDIED BY GRAZING-INCIDENCE X-RAY-DIFFRACTION [J].

AKIMOTO, K ;

MIZUKI, J ;

HIROSAWA, I ;

MATSUI, J .

APPLIED SURFACE SCIENCE, 1989, 41-2 :317-322

[2] COMPRESSIBILITY OF SOLID C60 [J].

FISCHER, JE ;

HEINEY, PA ;

MCGHIE, AR ;

ROMANOW, WJ ;

DENENSTEIN, AM ;

MCCAULEY, JP ;

SMITH, AB .

SCIENCE, 1991, 252 (5010) :1288-1290

[3]

Hong H., UNPUB

[4] X-RAY-SCATTERING STUDY OF AG/SI(111) BURIED INTERFACE STRUCTURES [J].

HONG, HW ;

ABURANO, RD ;

LIN, DS ;

CHEN, HD ;

CHIANG, TC ;

ZSCHACK, P ;

SPECHT, ED .

PHYSICAL REVIEW LETTERS, 1992, 68 (04) :507-510

[5] SOLID C60 [J].

HUFFMAN, DR .

PHYSICS TODAY, 1991, 44 (11) :22-29

[6] SOLID C-60 - A NEW FORM OF CARBON [J].

KRATSCHMER, W ;

LAMB, LD ;

FOSTIROPOULOS, K ;

HUFFMAN, DR .

NATURE, 1990, 347 (6291) :354-358

[7] A Fourier series method for the determination of the components of interatomic distances in crystals [J].

Patterson, AL .

PHYSICAL REVIEW, 1934, 46 (05) :0372-0376

[8] OBSERVATION OF STRAIN IN THE SI(111) 7X7 SURFACE [J].

ROBINSON, IK ;

WASKIEWICZ, WK ;

FUOSS, PH ;

NORTON, LJ .

PHYSICAL REVIEW B, 1988, 37 (08) :4325-4328

[9] ORDERING AT SI(111)/A-SI AND SI(111)/SIO2 INTERFACES [J].

ROBINSON, IK ;

WASKIEWICZ, WK ;

TUNG, RT ;

BOHR, J .

PHYSICAL REVIEW LETTERS, 1986, 57 (21) :2714-2717

[10] X-RAY-DIFFRACTION EVIDENCE OF ADATOMS IN THE SI(111)7X7 RECONSTRUCTED SURFACE [J].

ROBINSON, IK ;

WASKIEWICZ, WK ;

FUOSS, PH ;

STARK, JB ;

BENNETT, PA .

PHYSICAL REVIEW B, 1986, 33 (10) :7013-7016