INFLUENCE OF DIRECT TRANSITIONS BETWEEN SPIN BRANCHES ON FREE-CARRIER ABSORPTION OF FERROMAGNETIC SEMICONDUCTORS

被引:1
|
作者
ALMEIDA, NS [1 ]
MIRANDA, LCM [1 ]
机构
[1] UNIV BRASILIA,DEPT FIS,BRASILIA,DF,BRAZIL
关键词
D O I
10.1016/0375-9601(81)90310-8
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:78 / 80
页数:3
相关论文
共 50 条
  • [31] PARAMETRIC-INSTABILITY OF PHONONS IN FREE-CARRIER SEMICONDUCTORS
    NUNES, OAC
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1982, 112 (02): : K131 - K135
  • [32] MICROWAVE FREE-CARRIER FARADAY EFFECT IN PIEZOELECTRIC SEMICONDUCTORS
    ARORA, AK
    GUPTA, BM
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (12) : 1603 - &
  • [33] IMPURITY-INDUCED FREE-CARRIER MAGNETOABSORPTION IN SEMICONDUCTORS
    BASTARD, G
    MYCIELSKI, J
    RIGAUX, C
    PHYSICAL REVIEW B, 1978, 18 (12): : 6990 - 6995
  • [34] Free-Carrier Absorption Assisted Photoelectrochemistry of Silicon
    Lee, Benjamin T-H
    Chiang, C. C.
    Hwang, Y. R.
    SELECTED PROCEEDINGS FROM THE 232ND ECS MEETING, 2017, 80 (10): : 1113 - 1125
  • [35] FREE-CARRIER ABSORPTION FOR 10 MU MODULATION
    DECREMOU.B
    LEIBA, E
    PROCEEDINGS OF THE IEEE, 1969, 57 (09) : 1674 - &
  • [36] FREE-CARRIER ABSORPTION IN SEMICONDUCTOR-LASERS
    HAUG, A
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (03) : 373 - 378
  • [37] INFLUENCE OF DEEP TRAPS ON MEASUREMENT OF FREE-CARRIER DISTRIBUTIONS IN SEMICONDUCTORS BY JUNCTION CAPACITANCE TECHNIQUES
    KIMERLING, LC
    JOURNAL OF APPLIED PHYSICS, 1974, 45 (04) : 1839 - 1845
  • [38] PHOTOINDUCED FREE-CARRIER ABSORPTION IN MICROCRYSTALLINE SILICON
    LIU, HN
    PFOST, D
    TAUC, J
    SOLID STATE COMMUNICATIONS, 1984, 50 (11) : 987 - 990
  • [39] Free-carrier absorption in quantum cascade structures
    Carosella, F.
    Ndebeka-Bandou, C.
    Ferreira, R.
    Dupont, E.
    Unterrainer, K.
    Strasser, G.
    Wacker, A.
    Bastard, G.
    PHYSICAL REVIEW B, 2012, 85 (08):
  • [40] Modelling free-carrier absorption in solar cells
    Clugston, DA
    Basore, PA
    PROGRESS IN PHOTOVOLTAICS, 1997, 5 (04): : 229 - 236