SELF-CONSISTENT PROCEDURE FOR POINT-DEFECTS IN TIGHT-BINDING SYSTEMS - APPLICATION TO SEMICONDUCTORS

被引：21
|
作者：
LANNOO, M [1 ]
机构：
[1] INST SUPER ELECTR N,CNRS,EQUIPE RECH PHYS SOLIDES,3 RUE FRANCOIS BAES,F-59046 LILLE,FRANCE
来源：
PHYSICAL REVIEW B | 1974年 / 10卷 / 06期
关键词：
D O I：
10.1103/PhysRevB.10.2544
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：2544 / 2553
页数：10
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