PULSE-MODULATED INTERFEROMETER FOR MEASURING INTENSITY-INDUCED PHASE-SHIFTS

被引:12
作者
ROCHFORD, KB [1 ]
ZANONI, R [1 ]
STEGEMAN, GI [1 ]
KRUG, W [1 ]
MIAO, E [1 ]
BERANEK, MW [1 ]
机构
[1] BOEING AEROSP & ELECTR,CTR HIGH TECHNOL,SEATTLE,WA 98124
基金
美国国家科学基金会;
关键词
D O I
10.1109/3.159514
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Single-polarization interferometric measurements of intensity-induced refractive index changes using an intensity-modulated mode-locked laser are reported. The technique is used to determine the electronic and thermal intensity-dependent index changes in a polydiacetylene waveguide. Monte Carlo analysis shows that a sensitivity of at least 0.02 radians is expected from the present configuration.
引用
收藏
页码:2044 / 2050
页数:7
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