ATOMIC-FORCE MICROSCOPY

被引：17

作者：

BINNIG, GK ^{[1
]}

机构：

[1] IBM,DIV RES,PHYS GRP,D-8000 MUNICH 40,FED REP GER

来源：

PHYSICA SCRIPTA | 1987年 / T19A卷

关键词：

D O I：

10.1088/0031-8949/1987/T19A/008

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：53 / 54

页数：2

共 16 条

[1]

BINNIG G, 1986, IBM J RES DEV, V30, P355

[2] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[3]

BINNIG G, 1987, EUROPHYS LETT, V3

[4] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J].

BRYANT, A ;

SMITH, DPE ;

QUATE, CF .

APPLIED PHYSICS LETTERS, 1986, 48 (13) :832-834

[5]

DURIG U, 1986, JUL STM 86 C SANT CO

[6] STUDY OF SURFACE-TOPOGRAPHY IN IMPACT-WEAR [J].

ENGEL, PA ;

MILLIS, DB .

WEAR, 1982, 75 (02) :423-442

[7] THE TUNNELING MICROSCOPE - A NEW LOOK AT THE ATOMIC WORLD [J].

GOLOVCHENKO, JA .

SCIENCE, 1986, 232 (4746) :48-53

[8] SURFACE-ROUGHNESS MEASUREMENTS OF LOW-SCATTER MIRRORS AND ROUGHNESS STANDARDS [J].

GUENTHER, KH ;

WIERER, PG ;

BENNETT, JM .

APPLIED OPTICS, 1984, 23 (21) :3820-3836

[9]

MCCLELLAND GM, 1987, IN PRESS REV PROG QU, V6

[10]

NIKSCH M, IN PRESS

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