DETERMINATION OF REFRACTIVE-INDEX AND THICKNESS OF A TRANSPARENT FILM

被引：26

作者：

KHAWAJA, E ^{[1
]}

机构：

[1] LASER GRP,PINSTECH,RAWALPINDI,PAKISTAN

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1976年 / 9卷 / 14期

关键词：

D O I：

10.1088/0022-3727/9/14/003

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1939 / 1943

页数：5

共 50 条

[21] INTERFERENCE METHOD FOR MONITORING THE REFRACTIVE-INDEX AND THE THICKNESS OF TRANSPARENT FILMS DURING DEPOSITION
ALIUS, H
SCHMIDT, R
REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (04): : 1200 - 1203
[22] A MINIATURE INTERFEROMETRY SENSOR FOR MONITORING THE CHANGES OF FILM THICKNESS AND REFRACTIVE-INDEX
CHI, W
REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (04): : 1021 - 1022
[23] SYNCANG METHOD FOR SIMULTANEOUS MEASUREMENT OF FILM REFRACTIVE-INDEX AND THICKNESS - COMMENT
KERSTEN, RT
THIN SOLID FILMS, 1975, 26 (02) : L27 - L28
[24] Determination of thin film refractive index and thickness by means of film phase thickness
Nenkov, Milen R.
Pencheva, Tamara G.
CENTRAL EUROPEAN JOURNAL OF PHYSICS, 2008, 6 (02): : 332 - 343
[25] DETERMINATION OF MYOPLASMIC REFRACTIVE-INDEX
AIZU, M
OGAWA, Y
FOLIA PHARMACOLOGICA JAPONICA, 1986, 87 (03) : P12 - P13
[26] ON A METHOD FOR REFRACTIVE-INDEX DETERMINATION
NAUMENKO, VI
OPTIKA I SPEKTROSKOPIYA, 1989, 66 (03): : 629 - 632
[27] DETERMINATION OF LAYER THICKNESS AND REFRACTIVE-INDEX OF THE LAYERS OF MULTILAYER SYSTEMS BY ELLIPSOMETRY
FLAMME, B
SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1980, 9 (04): : 236 - 241
[28] METHOD OF REFRACTIVE-INDEX MEASUREMENT FOR TRANSPARENT SUBSTANCES
ODARICH, VA
OPTIKA I SPEKTROSKOPIYA, 1974, 37 (04): : 761 - 764
[29] FABRY-PEROT LASER INTERFEROMETRY TO MEASURE REFRACTIVE-INDEX OR THICKNESS OF TRANSPARENT MATERIALS
LUNAZZI, JJ
GARAVAGLIA, M
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (03): : 237 - 240
[30] METHOD FOR MEASURING THE REFRACTIVE-INDEX OF TRANSPARENT SOLIDS
BASS, JD
WEIDNER, DJ
REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (10): : 1569 - 1573

← 1 2 3 4 5 →