CHARACTERISATION OF THIN SURFACE FILMS ON GERMANIUM IN VARIOUS SOLVENTS BY ELLIPSOMETRY

被引：11
|
作者：
EHMAN, MF
VEDAM, K
WHITE, WB
FAUST, JW
机构：
来源：
JOURNAL OF MATERIALS SCIENCE | 1971年 / 6卷 / 07期
关键词：
D O I：
10.1007/BF00549947
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：969 / &
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