ESR Measurements of HOPG Irradiated with Highly Charged Ions

被引：4
作者：
Nishida, Naofumi [1 ]
Betsumiya, Koji [1 ]
Sakurai, Makoto [1 ]
Sakurai, Takahiro [1 ]
Terui, Toshifumi [2 ]
Honda, Shin-ichi [3 ]
机构：
[1] Kobe Univ, Dept Phys, Nada Ku, 1-1 Rokkodai, Kobe, Hyogo 6578501, Japan
[2] Natl Inst Informat & Commun Technol, Nishi Ku, 588-2 Iwaoka, Kobe, Hyogo 6512492, Japan
[3] Univ Hyogo, Grad Sch Engn, 2167 Shosha, Himeji, Hyogo 6712280, Japan
来源：
E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY | 2018年 / 16卷
关键词：
Highly charged ion; HOPG; Electron spin resonance; Ion bombardment; Ion implantation; Ion-solid interactions;
D O I：
10.1380/ejssnt.2018.356
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Electron spin resonance (ESR) measurements were performed on highly oriented pyrolytic graphite (HOPG) samples irradiated with highly charged ions (HCIs). The interaction between a HCI and surfaces results in emission of photons in the range of visible to X-ray, hundreds of secondary electrons, sputtering of secondary ions and modification of surface structure in nanometer scale. In the present experiments, HCIs were produced by electron beam ion source (EBIS) and Ar8+ and Ar14+ were used for the irradiation. ESR measurement provides information on unpaired electrons of the sample. We investigated the dependence of defect formation on charge state and fluence of incident HCIs using ESR. The L1 line appeared in HOPG samples irradiated with HCIs at the low temperature region, and the intensity became larger at higher charge state and higher fluence.
引用
收藏
页码：356 / 359
页数：4
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