EVALUATION OF AN EQUATION FOR BREMSSTRAHLUNG BACKGROUND IN ELECTRON-PROBE X-RAY-MICROANALYSIS OF COMPOSITE SAMPLES

被引：5

作者：

MARKOWICZ, A ^{[1
]}

STORMS, H ^{[1
]}

VANGRIEKEN, R ^{[1
]}

机构：

[1] UNIV INSTELLING ANTWERP,DEPT CHEM,B-2610 WILRIJK,BELGIUM

来源：

X-RAY SPECTROMETRY | 1986年 / 15卷 / 02期

关键词：

D O I：

10.1002/xrs.1300150211

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：131 / 133

页数：3

共 10 条

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[10] BACKGROUND CORRECTIONS FOR QUANTITATIVE ELECTRON-MICROPROBE ANALYSIS USING A LITHIUM DRIFTED SILICON X-RAY DETECTOR [J].

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