HIGH-RESOLUTION MEASUREMENTS OF ATOMIC AND MOLECULAR LIFETIMES USING HIGH-FREQUENCY DEFLECTION TECHNIQUE

被引：93
作者：
ERMAN, P [1 ]
机构：
[1] RES INST PHYS, S-10405 STOCKHOLM, SWEDEN
来源：
PHYSICA SCRIPTA | 1975年 / 11卷 / 02期
关键词：
D O I：
10.1088/0031-8949/11/2/001
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：65 / 78
页数：14
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