CORRECTION OF THE 2ND-ORDER ABERRATIONS OF UNIFORM-FIELD MAGNETIC SECTORS

被引:43
作者
SHUMAN, H [1 ]
机构
[1] UNIV PENN,DEPT PHYSIOL & PATHOL,PHILADELPHIA,PA 19104
关键词
Compendex;
D O I
10.1016/0304-3991(80)90010-8
中图分类号
TH742 [显微镜];
学科分类号
摘要
MICROSCOPES, ELECTRON
引用
收藏
页码:45 / 53
页数:9
相关论文
共 11 条
[1]  
BROWN KL, 1967, SLAC75 REP
[2]  
COLLIEX C, 1978, ELECTRON MICROS, V3, P268
[3]   HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY [J].
CREWE, AV ;
ISAACSON, M ;
JOHNSON, D .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (04) :411-&
[4]   SIMPLE ELECTRON SPECTROMETER FOR ENERGY ANALYSIS IN TRANSMISSION MICROSCOPE [J].
EGERTON, RF .
ULTRAMICROSCOPY, 1978, 3 (01) :39-47
[5]  
ENGE HA, 1967, FOCUSING CHARGED PAR, V2, pCH4
[6]  
ENGEL W, 1978, 9TH P INT C EL MICR, V1, P48
[7]  
FIELDS JR, 1977, ULTRAMICROSCOPY, V2, P311
[8]   FOCUSING FOR DIPOLE MAGNETS WITH LARGE POLE GAP TO BENDING RADIUS RATIOS [J].
HEIGHWAY, EA .
NUCLEAR INSTRUMENTS & METHODS, 1975, 123 (03) :413-419
[9]  
JOHNSON DE, 1979, ULTRAMICROSCOPY, V3, P361
[10]   PRACTICAL ELECTRON SPECTROMETER FOR CHEMICAL-ANALYSIS [J].
JOY, DC ;
MAHER, DM .
JOURNAL OF MICROSCOPY-OXFORD, 1978, 114 (NOV) :117-129