共 5 条
[1]
ROUGHNESS MEASUREMENT USING A SHEARING INTERFERENCE MICROSCOPE
[J].
APPLIED OPTICS,
1986, 25 (05)
:764-768
[2]
STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES
[J].
APPLIED OPTICS,
1981, 20 (10)
:1785-1802
[3]
SURFACE-ROUGHNESS MEASUREMENTS OF LOW-SCATTER MIRRORS AND ROUGHNESS STANDARDS
[J].
APPLIED OPTICS,
1984, 23 (21)
:3820-3836